F-Scanner

With its F-Scanner family of devices, Fraunhofer IPM offers sensitive measuring systems that detect contamination or defects on surfaces directly in the production line. By using a combination of imaging fluorescence measurement and laser scanners, the F-Scanners detect organic contamination of just a few milligrams per square meter. The scanning systems enable 100-percent inspection while generating a high-resolution map that reflects the distribution of organic substances on the surface. Beyond the inspection of component cleanliness or coating this often also indicates issues in the production process.