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HoloTop NX

The digital holographic measurement system HoloTop NX enables micrometer-accurate quality control of precision components. Thanks to its compact design, it enables 3D inline measurements directly in multi-axis systems. The sensor can be installed on a number of different platforms. Using multiwavelength digital holography, HoloTop NX maps the topography even of rough object surfaces with interferometric accuracy. The sensor captures an area of 12.5 × 12.5 mm² within 500 ms. Even deviations of a few micrometers can thus be reworked directly in the machine tool without the need to first reposition the workpiece. The acquired images are processed particularly quickly, while data preprocessing guarantees good robustness to vibrations.

https://www.ipm.fraunhofer.de/en/bu/production-control-inline-measurement-techniques/systems/holo-top-nx.html
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